FEI Helios NanoLab 600i Focussed Ion Beam scanning electron microscope
The Focussed Ion Beam (FIB) can be used for high-resolution imaging and as a tool to machine micron-scale test pieces into the surface of a sample.
-
-
FISPACT-II
FISPACT II is advanced nuclear simulation software providing predictive, spectral and temporal simulation methods using comprehensive nuclear data libraries.
-
Gatan Precision Ion Polishing System (PIPS II)
The PIPS II utilises two coincident beams of low energy argon ions to slowly sputter away material from a localised region of a sample.
-
Grindosonic Mk7 Impulse Excitation Technique
Non-destructive measurements of sample resonant frequencies to allow for the determination of Youngs Modulus.
-
Heating by Induction to Verify Extremes – HIVE
Performance evaluation and verification of small-scale components and samples under heat fluxes up to 20 MW/m2 and from room temperature to ~3000 °C in a highly flexible and adaptable facility
-
JEOL NEOARM scanning transmission electron microscope
Atomic resolution scanning transmission electron microscope coupled with Protochips – Atmosphere system for in-situ gas cell and heating experiments.
-
Laser Flash Analysis: Linseis LFA 1000
The Laser Flash Analysis is used for the determination of heat transport properties such as thermal diffusivity and thermal conductivity.
-
NESO-Particles
NESO-Particles is a performance portable library for particle data and looping operations for the fusion use case.
-
Netzsch Differential Scanning Calorimeter Precision and Mass Spectrometer
Two high vacuum Differential Scanning Calorimeter machines allow for determination of caloric effects of a sample by measurement of the difference in the heat flow rate between a sample and a reference.
-
Physical Properties Measurement System: Quantum Design DynaCool™
Electrical, magnetic and thermophysical material characterisation at magnetic fields of up to 14 T and temperatures between 400 – 1.8 K.