You can browse this list of facilities and equipment, or search a full list.
-
Agilent Nanoindenter G200-1
Analysis of the mechanical behaviour of a material by pressing a microscopically small tip into a sample and measuring the required load versus the displacement of the tip into the…
-
Atom force microscope: Dimension D3100
Imaging technique for very high-resolution three-dimensional image of sample surface.
-
Carbolite Gero Vacuum Tube Furnace
A vacuum tube furnace for processing or testing of materials at high temperatures.
-
CHIMERA
Designed to address the specific engineering challenges associated with fusion and validate complex, bespoke and high-risk manufacturing.
-
Digital image correlation: LaVision µDIC
- Services
- Materials Research Facility
- Mechanical testing
- Under development
- Materials
- Facilities and equipment
Micro-scale measurement of 3D strain, displacement and shape.
-
Dilatometer: Linseis L75V PT
- Services
- Materials Research Facility
- Thermo-physical characterisation
- Materials
- Facilities and equipment
The Dilatometer is used to measure the thermal expansion of materials as a function of temperature.
-
FEI Helios NanoLab 600i Focussed Ion Beam scanning electron microscope
The Focussed Ion Beam (FIB) can be used for high-resolution imaging and as a tool to machine micron-scale test pieces into the surface of a sample.
-
Gatan Precision Ion Polishing System (PIPS II)
The PIPS II utilises two coincident beams of low energy argon ions to slowly sputter away material from a localised region of a sample.
-
Grindosonic Mk7 Impulse Excitation Technique
Non-destructive measurements of sample resonant frequencies to allow for the determination of Youngs Modulus.
-
Heating by Induction to Verify Extremes – HIVE
Performance evaluation and verification of small-scale components and samples under heat fluxes up to 20 MW/m2 and from room temperature to ~3000 °C in a highly flexible and adaptable facility
-
JEOL NEOARM scanning transmission electron microscope
Atomic resolution scanning transmission electron microscope coupled with Protochips – Atmosphere system for in-situ gas cell and heating experiments.
-
Laser Flash Analysis: Linseis LFA 1000
- Services
- Materials Research Facility
- Thermo-physical characterisation
- Under development
- Materials
- Facilities and equipment
The Laser Flash Analysis is used for the determination of heat transport properties such as thermal diffusivity and thermal conductivity.
-
Netzsch Differential Scanning Calorimeter Precision and Mass Spectrometer
- Services
- Materials Research Facility
- Thermo-physical characterisation
- Under development
- Materials
- Facilities and equipment
Two high vacuum Differential Scanning Calorimeter machines allow for determination of caloric effects of a sample by measurement of the difference in the heat flow rate between a sample and…
-
Physical Properties Measurement System: Quantum Design DynaCool™
- Services
- Materials Research Facility
- Thermo-physical characterisation
- Materials
- Facilities and equipment
Electrical, magnetic and thermophysical material characterisation at magnetic fields of up to 14 T and temperatures between 400 – 1.8 K.
-
Plastic Fabrication Workshop
Creating bespoke, flexible and affordable containment solutions
-
Rigaku Smartlab X-ray diffractometer
Automated multipurpose X-Ray diffractometer (XRD) with guidance software.
-
Robotics facilities
We have some of the best facilities in the world for developing remote handling robotics.
-
Simultaneous Thermal Analyser: Linseis STA PT1600
- Services
- Materials Research Facility
- Thermo-physical characterisation
- Under development
- Materials
- Facilities and equipment
The Simultaneous Thermal Analyser combines thermo-gravimetric analysis with differential scanning calorimetry.
-
TA Electroforce 3550 15kN dynamic load frame
- Services
- Materials Research Facility
- Mechanical testing
- Under development
- Materials
- Facilities and equipment
Mechanical fatigue, fracture toughness/crack growth and dynamic characterisation testing.
-
TESCAN AMBER X Plasma Focussed Ion Beam Scanning Electron Microscope
The PFIB is a dual-beam system with both an electron beam and a xenon ion beam.
-
TESCAN Mira3 XMH scanning electron microscope
The TESCAN MIRA3 is a high-performance scanning electron microscope system which provides high resolution and low-noise imaging.