Agilent Nanoindenter G200-1
Analysis of the mechanical behaviour of a material by pressing a microscopically small tip into a sample and measuring the required load versus the displacement of the tip into the surface.
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Atom force microscope: Dimension D3100
Imaging technique for very high-resolution three-dimensional image of sample surface.
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Carbolite Gero Vacuum Tube Furnace
A vacuum tube furnace for processing or testing of materials at high temperatures.
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CHIMERA
Designed to address the specific engineering challenges associated with fusion and validate complex, bespoke and high-risk manufacturing.
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Digital image correlation: LaVision µDIC
Micro-scale measurement of 3D strain, displacement and shape.
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Dilatometer: Linseis L75V PT
The Dilatometer is used to measure the thermal expansion of materials as a function of temperature.
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FEI Helios NanoLab 600i Focussed Ion Beam scanning electron microscope
The Focussed Ion Beam (FIB) can be used for high-resolution imaging and as a tool to machine micron-scale test pieces into the surface of a sample.
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Gatan Precision Ion Polishing System (PIPS II)
The PIPS II utilises two coincident beams of low energy argon ions to slowly sputter away material from a localised region of a sample.
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Grindosonic Mk7 Impulse Excitation Technique
Non-destructive measurements of sample resonant frequencies to allow for the determination of Youngs Modulus.
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Heating by Induction to Verify Extremes – HIVE
Performance evaluation and verification of small-scale components and samples under heat fluxes up to 20 MW/m2 and from room temperature to ~3000 °C in a highly flexible and adaptable facility