Agilent Nanoindenter G200-1
Analysis of the mechanical behaviour of a material by pressing a microscopically small tip into a sample and measuring the required load versus the displacement of the tip into the surface.
Analysis of the mechanical behaviour of a material by pressing a microscopically small tip into a sample and measuring the required load versus the displacement of the tip into the surface.
Imaging technique for very high-resolution three-dimensional image of sample surface.
A vacuum tube furnace for processing or testing of materials at high temperatures.
Micro-scale measurement of 3D strain, displacement and shape.
The Dilatometer is used to measure the thermal expansion of materials as a function of temperature.
The Focussed Ion Beam (FIB) can be used for high-resolution imaging and as a tool to machine micron-scale test pieces into the surface of a sample.
UKAEA and partners are developing fusion-ready steels that are stronger, safer and scalable, helping build the foundations for future fusion power plants.
The PIPS II utilises two coincident beams of low energy argon ions to slowly sputter away material from a localised region of a sample.
Non-destructive measurements of sample resonant frequencies to allow for the determination of Youngs Modulus.
Atomic resolution scanning transmission electron microscope coupled with Protochips – Atmosphere system for in-situ gas cell and heating experiments.