Agilent Nanoindenter G200-1
Analysis of the mechanical behaviour of a material by pressing a microscopically small tip into a sample and measuring the required load versus the displacement of the tip into the surface.
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Atom force microscope: Dimension D3100
Imaging technique for very high-resolution three-dimensional image of sample surface.
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Carbolite Gero Vacuum Tube Furnace
A vacuum tube furnace for processing or testing of materials at high temperatures.
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Digital image correlation: LaVision µDIC
Micro-scale measurement of 3D strain, displacement and shape.
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Dilatometer: Linseis L75V PT
The Dilatometer is used to measure the thermal expansion of materials as a function of temperature.
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FEI Helios NanoLab 600i Focussed Ion Beam scanning electron microscope
The Focussed Ion Beam (FIB) can be used for high-resolution imaging and as a tool to machine micron-scale test pieces into the surface of a sample.
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Gatan Precision Ion Polishing System (PIPS II)
The PIPS II utilises two coincident beams of low energy argon ions to slowly sputter away material from a localised region of a sample.
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Grindosonic Mk7 Impulse Excitation Technique
Non-destructive measurements of sample resonant frequencies to allow for the determination of Youngs Modulus.
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JEOL NEOARM scanning transmission electron microscope
Atomic resolution scanning transmission electron microscope coupled with Protochips – Atmosphere system for in-situ gas cell and heating experiments.
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Laser Flash Analysis: Linseis LFA 1000
The Laser Flash Analysis is used for the determination of heat transport properties such as thermal diffusivity and thermal conductivity.