Atom force microscope: Dimension D3100
Imaging technique for very high-resolution three-dimensional image of sample surface.
Imaging technique for very high-resolution three-dimensional image of sample surface.
A vacuum tube furnace for processing or testing of materials at high temperatures.
The Focussed Ion Beam (FIB) can be used for high-resolution imaging and as a tool to machine micron-scale test pieces into the surface of a sample.
Atomic resolution scanning transmission electron microscope coupled with Protochips – Atmosphere system for in-situ gas cell and heating experiments.
Automated multipurpose X-Ray diffractometer (XRD) with guidance software.
The PFIB is a dual-beam system with both an electron beam and a xenon ion beam.
The TESCAN MIRA3 is a high-performance scanning electron microscope system which provides high resolution and low-noise imaging.
Raman spectroscopy uses a laser to probe a sample to investigate the roto-vibrational states with in it.