Instrument overview
200 kV scanning transmission electron microscope with 4D-STEM, EDS, ADF, HAADF, bright-field and backscattered electron detectors. Capable of atomic resolution imaging in both TEM and STEM modalities. Protochips – Atmosphere system is also available for observing structural/chemical changes of materials in gaseous environments within the NEOARM.
Applications
- assessing radiation damage down to the atomic scale
- chemical characterisation of materials
- nano-particle/precipitates dispersion mapping
- observing phase segregation
- observing microstructural and chemical changes of materials in gaseous environments
NEOARM technical specification
- maximum BF/DF resolution – TEM: 2.70 Å, STEM: 0.82 Å
- 4D STEM – Merlin 4S direct electron detector, up to 2000 fps in 12-bit mode
- EDS – JEOL dual, dry, windowless EDS detectors with combined solid angle of 2.2 sr, and combined detection area of 320 mm2. Detectable elements: Be – U
- TEM – OneView IS Camera
- STEM – ADF, HAADF and BF Detectors
- JEOL IDES EDM Electrostatic Dose Modulator
- Analytical Double Tilt Holder – Tilt range: ± 36o x, ± 36o y
- Magnetic Specimen Double Tilt Holder – Tilt range: ± 44o x, ± 31o y
Protochips technical specification
- currently available gasses: He, N2, Ar (more to be added)
- heating – Up to 1000oC, maximum ramping rate 10oC/s
- gas flow rate – From 0.005 – 1 mL/min
- maximum experimental gas pressure – 1 atmosphere
- three gas inputs + two gas tanks for experimental gas mixing
Materials Research Facility
Available for users working in fusion, fission and other research programmes. We have scientific and operational teams to support experiments and sample preparation.