JEOL NEOARM scanning transmission electron microscope

Atomic resolution scanning transmission electron microscope coupled with Protochips – Atmosphere system for in-situ gas cell and heating experiments.

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Overview

200 kV scanning transmission electron microscope with 4D-STEM, EDS, ADF, HAADF, bright-field and backscattered electron detectors. Capable of atomic resolution imaging in both TEM and STEM modalities. Protochips – Atmosphere system is also available for observing structural/chemical changes of materials in gaseous environments within the NEOARM.

The scanning electron microscope in the lab.
200 kV JEOL NEOARM Scanning Transmission Electron Microscope

Applications

  • assessing radiation damage down to the atomic scale
  • chemical characterisation of materials
  • nano-particle/precipitates dispersion mapping
  • observing phase segregation
  • magnetic fields and strain mapping
  • observing microstructural and chemical changes of materials in gaseous environments

NEOARM Technical Specification

  • maximum BF/DF resolution – TEM: 2.70 Å, STEM: 0.82 Å
  • 4D STEM – Direct electron detection, up to 2000 fps in 12-bit mode
  • EDS – Dual EDS detectors with combined solid angle of 2.2 sr

Protochips Technical Specification

  • currently available gasses: He, N2, Ar (more to be added)
  • heating – Up to 1000oC, maximum ramping rate 10oC/s
  • gas flow rate – From 0.005 – 1 mL/min
  • maximum experimental gas pressure – 1 atmosphere
  • three gas inputs + two gas tanks for experimental gas mixing
The 200 kV scanning transmission electron microscope with the Protochips – Atmosphere Gas Cell System in the laboratory.
Protochips – Atmosphere Gas Cell System coupled with the JEOL NEOARM